Testing of High Power Microprocessors

As microprocessor clock speeds and wattage continue to climb, production Burn-In and Test has shifted to the testing of these high-power microprocessors with precise temperature control over a wide temperature range. Utilizing our expertise in temperature and environmental control units, Semifab has developed an integrated system solution that speeds microprocessor testing at all levels of test and characterization.

SEMIFAB ADVANCED MICROPROCESSOR TEST UNIT -- FEATURES AND BENEFITS

• Able to test at an industry leading 250W per device under test
• Independent precision temperature control for each device under test
• Moisture and condensation in humid ambient environments are eliminated
• Suitable from R and D through production, and is automation compatible
• High accuracy junction temperature sensing and control
• Can test with or without Thermal Interface Material

The standard operating parameters are:

• Operating temperature: -70 degrees C to +125 degrees C
• Temperature control: +/- 1 degree C
• Devices per system: Up to 100

We are excited about this solution set, and look forward to discussing how this unit can address your newest high power microprocessor testing requirements.